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Single-probe Systems

MicroLab

50000 MHz - 110000 MHz

µ-Lab is suited for the collection of far-field and near-field electromagnetic data of chips and miniature antenna assemblies in the millimeter waveband. It is the ideal measurement system for testing M2M devices using WiGig technology. The extra-wide door on this compact anechoic chamber enables easy access and mounting of the DUT. µ-Lab is a portable turn-key system that can be moved to any preferred location. MVG’s 959 Spectrum software complements the µ-Lab for complete data acquisition and analysis.

References:

  • MicroLab
MicroLab
MicroLab
MicroLab
MicroLab
MicroLab
MicroLab

MEASUREMENT CAPACITIES

  • Gain
  • Directivity
  • Sidelobe levels - user-defined criteria
  • Null depth- search for user-defined null level (e.g, -3, -10, etc.)
  • Time domain response capacity
  • Dynamic density control - real time speed adjustments
  • Beam width - user-defined beamwidth analysis (1 dB, 3 dB, etc.)
  • Pass/fail criteria - user defined specification levels (e.g., minimum gain spec over angular region)
  • Capabilities up to 2 millimeter wave bands (V and W), others upon request

FREQUENCY BANDS

  • 50 to 110 GHz
  • 20 to 50 GHz optional
  • Other bands possible upon request

TECHNOLOGY

  • Near-field / Spherical
  • Far-field / Spherical

MAX. SIZE OF DUT

  • On centered support column: as large as a standard laptop
  • On offset column for chip measurements: 5 cm x 5 cm (chipset)

DYNAMIC RANGE

  • > 60 dB between 50 to 110 GHz

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See mm-Wave Chip Reference Antennas

mm-Wave Chip Reference Antennas

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Related resources

See TAC Boosts Research, Resources, and Recruitment for FIU

TAC Boosts Research, Resources, and Recruitment for FIU

Case studies

See See MicroLab in action!

See MicroLab in action!

Videos

See Experimental validation of Reference Chip Antennas for 5G Measurement Facilities at mm-Wave

Experimental validation of Reference Chip Antennas for 5G Measurement Facilities at mm-Wave

Technical Papers

See High Performance Dual Polarized Near-Field Probe at V-Band Provides Increased Performances for Millimeter Wave Spherical Near-Field Measurements

High Performance Dual Polarized Near-Field Probe at V-Band Provides Increased Performances for Millimeter Wave Spherical Near-Field Measurements

Technical Papers

See Chip Reference Antennas: Improving Millimeter-Wave On-Chip Antenna Measurements

Chip Reference Antennas: Improving Millimeter-Wave On-Chip Antenna Measurements

Technical Papers

See Challenges of 60 GHz On-Chip Antenna Measurements

Challenges of 60 GHz On-Chip Antenna Measurements

Technical Papers

See 60 GHz Reference Chip Antenna for Gain Verification of Millimeter Wave Test Chambers

60 GHz Reference Chip Antenna for Gain Verification of Millimeter Wave Test Chambers

Technical Papers

See Antenna Measurement and Radome Test Systems Product Overview

Antenna Measurement and Radome Test Systems Product Overview

Product Catalogs

See 5G Antenna Test and Measurement Systems Overview

5G Antenna Test and Measurement Systems Overview

Product Catalogs

See Antenna Product Overview

Antenna Product Overview

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