Single-probe Systems

MicroLab

50000 MHz - 110000 MHz

µ-Lab is suited for the collection of far-field and near-field electromagnetic data of chips and miniature antenna assemblies in the millimeter waveband. It is the ideal measurement system for testing M2M devices using WiGig technology. The extra-wide door on this compact anechoic chamber enables easy access and mounting of the DUT. µ-Lab is a portable turn-key system that can be moved to any preferred location. MVG’s 959 Spectrum software complements the µ-Lab for complete data acquisition and analysis.

Références:

MicroLab

MicroLab

MicroLab

MicroLab

MEASUREMENT CAPACITIES

Gain
Directivity
Sidelobe levels - user-defined criteria
Null depth- search for user-defined null level (e.g, -3, -10, etc.)
Time domain response capacity
Dynamic density control - real time speed adjustments
Beam width - user-defined beamwidth analysis (1 dB, 3 dB, etc.)
Pass/fail criteria - user defined specification levels (e.g., minimum gain spec over angular region)
Capabilities up to 2 millimeter wave bands (V and W), others upon request

FREQUENCY BANDS

50 to 110 GHz
20 to 50 GHz optional
Other bands possible upon request

TECHNOLOGY

Near-field / Spherical
Far-field / Spherical

MAX. SIZE OF DUT

On centered support column: as large as a standard laptop
On offset column for chip measurements: 5 cm x 5 cm (chipset)

DYNAMIC RANGE

> 60 dB between 50 to 110 GHz

Produits associés

Mini-Compact Range

Mini-Compact Range

4000 MHz - 110000 MHz

StarLab 50 GHz

StarLab 50 GHz

650 MHz - 50000 MHz

mm-Wave Chip Reference Antennas

mm-Wave Chip Reference Antennas

24250 MHz - 64000 MHz

Ressources associées

TAC Boosts Research, Resources, and Recruitment for FIU

TAC Boosts Research, Resources, and Recruitment for FIU

Études de cas

See MicroLab in action!

See MicroLab in action!

Vidéos

Experimental validation of Reference Chip Antennas for 5G Measurement Facilities at mm-Wave

Experimental validation of Reference Chip Antennas for 5G Measurement Facilities at mm-Wave

Documents techniques

High Performance Dual Polarized Near-Field Probe at V-Band Provides Increased Performances for Millimeter Wave Spherical Near-Field Measurements

High Performance Dual Polarized Near-Field Probe at V-Band Provides Increased Performances for Millimeter Wave Spherical Near-Field Measurements

Documents techniques

Chip Reference Antennas: Improving Millimeter-Wave On-Chip Antenna Measurements

Chip Reference Antennas: Improving Millimeter-Wave On-Chip Antenna Measurements

Documents techniques

Challenges of 60 GHz On-Chip Antenna Measurements

Challenges of 60 GHz On-Chip Antenna Measurements

Documents techniques

60 GHz Reference Chip Antenna for Gain Verification of Millimeter Wave Test Chambers

60 GHz Reference Chip Antenna for Gain Verification of Millimeter Wave Test Chambers

Documents techniques

Antenna Measurement and Radome Test Systems Product Overview

Antenna Measurement and Radome Test Systems Product Overview

Catalogues produits

5G Antenna Test and Measurement Systems Overview

5G Antenna Test and Measurement Systems Overview

Catalogues produits

Antenna Product Overview

Antenna Product Overview

Catalogues produits

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