From antenna prototyping to fully operational device measurements, MVG measurement systems and software effectively and efficiently support the complete design process of wireless devices through antenna and OTA measurements capabilities.
In the typical design process of a mobile wireless device, antenna measurements are necessary to ensure that the antenna is working as designed when integrated into its end product. In the process, there are many prototype iterations and builds which require passive antenna measurements at the start of the project, and active, OTA measurements once the device is capable.
From prototype to conformance testing, authentic antenna measurements and complete device testing can be performed quickly and effectively with MVG measurement systems and software.
Related resources
Infographic - Which MVG multi-probe near-field antenna test system fits your antenna testing needs?
Quick guide: Evaluating the scan area requirement for planar, cylindrical and spherical measurements
Design and Validation of Quasi Ideal Ultra-Wideband 3dB/180° Couplers for High Precision Spherical Near-Field Probes
Application of the TSWE Algorithm to Echo Reduction of Spherical Near-Field Measurements with Undersampling
Verification of Complex Excitation Coefficients from a Measured Space Array Antenna by the Equivalent Current Technique
Dual Polarized Wideband Feed with Cross-Polarization Reduction and Compensation Proprieties for Compact Antenna Test Ranges
Dual Polarized Near Field Probe Based on OMJ in Waveguide Technology Achieving More Than Octave Bandwidth
Design and Verification of Cross-Polarization Compensation Feed for Single Reflector Compact Antenna Test Range over a Wide Bandwidth
NF Measurements and Statistical Analysis of Random Electromagnetic Fields of Antennas and Other Emitters to Predict FF Pattern Statistics
Electrically thin VHF Array Elements for Satellite Applications Using Artificial Magnetic Material
Measured Antenna Representation of Flush Mounted Antennas for Computational Electromagnetic Solvers
Probe Correction Technique of Arbitrary Order for High Accuracy Spherical Near Field Antenna Measurements
Comparative Investigation of Spherical NF Measurements with Full and First Order Probe Correction Using Calibrated or Simulated Probe
Dual-Polarized Probe with Full Octave Bandwidth and Minimum Scattering for Planar Near Field Measurements
