测试物联网设备，以确保最佳的连接、电池寿命和共存性。
返回到行业
物联网测试挑战是独一无二且持续存在的。我们的测试系统也通过专为物联网优化设计的解决方案应对挑战，包括NB-IoT, LoRa, Sigfox, LTE-M和5G。
MVG提供的物联网测试解决方案可确保无线连接满足客户需求、优化天线性能并进行符合全球及区域标准的认证，通过精简浓缩、省时省力的方式获得精准可靠的结果，从而赢得了全球客户的信赖。
相关产品
StarWave
StarMIMO
400 MHz - 6000 MHz
SG 64
70 MHz - 18000 MHz
SG 24
400 MHz - 10000 MHz
StarLab
650 MHz - 18000 MHz
StarLab 50 GHz
650 MHz - 50000 MHz
MiniLAB | 6 GHz OTA
650 MHz - 6000 MHz
Antenna Measurement Services
SG 32
相关资源
5G and IoT challenges & testing solution in telecommunication Industry webinar
移动设备设计中的天线测试有哪些阶段？
MiniLAB | 6 GHz 介绍
Advancements in Antenna Measurement Techniques With Application to Civilian & Military Wireless Communication Devices
在 Taoglas 的 MVG SG 24
Updated Status on the Activities of the EurAAP Working Group on Antenna Measurements
Antenna Coupling Evaluation Based on Accurate Measured Source Models and Simulations
Validation of OTA Measurement Setup At 28GHz Using A Plan Wave Generator
Accurate Antenna Characterisation at VHF/UHF Frequencies with Plane Wave Generator Systems
Revision Progress IEEE Std 1720 Recommended Practice for Near-Field Antenna Measurements
天线测量和天线罩测试系统概述
5G Antenna Test and Measurement Systems Overview
60 GHz Reference Chip Antenna for Gain Verification of Millimeter Wave Test Chambers
OTA Testing of Antennas and Devices using Plane Wave Synthesizer
在通往快速RSE测试和测量的道路上
Relative Phase Reconstruction Based on Multiprobe Solutions and Post-Processing Techniques
Over the Air Testing of Active Antenna System Base Stations in Compact Antenna Test Range
Combining Measurements and Simulations for antenna coupling analysis
High Performance Dual Polarized Near-Field Probe at V-Band Provides Increased Performances for Millimeter Wave Spherical Near-Field Measurements
MVG WaveStudio Brochure
Measurement Uncertainties in Millimeter Wave “On-Chip” Antenna Measurements
Comparative Testing of Devices in a Spherical Near Field System and Plane Wave Generator
Design of Dual Polarized Wide Band Plane Wave Generator for Direct Far Field Testing
Reduced Sampling in NF Antenna Measurement Using Numerical Defined Expansion Functions
Testing Antenna Chip-Sets under Thermal Conditions
