测试集成在紧凑型、移动式和穿戴式设备中的天线的性能对于克服身体干扰和实现最佳连接至关重要。
返回到解决方案 返回类别 5G
测试可穿戴设备有一系列独特的挑战。由于必须在短时间内进入市场,再加上无故障的连接,在接近人体时效率会降低,而且可穿戴设备的体积也会变小,这些都是任何同类领先的天线测试解决方案的关键标准。 MVG利用探针阵列技术创造了一系列可穿戴设备测试解决方案,这要归功于其对近场球形几何形状的独特使用,可以在真人穿戴的多个位置对无线设备进行快速、准确的测试。
相关产品
StarWave
SG Evo
400 MHz - 50000 MHz
StarMIMO
400 MHz - 6000 MHz
SG 64
70 MHz - 18000 MHz
SG 24
400 MHz - 10000 MHz
StarLab
650 MHz - 18000 MHz
StarLab 50 GHz
650 MHz - 50000 MHz
MiniLAB | 6 GHz OTA
650 MHz - 6000 MHz
MVG WaveStudio
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相关资源
移动设备设计中的天线测试有哪些阶段?
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