测试集成在紧凑型、移动式和穿戴式设备中的天线的性能对于克服身体干扰和实现最佳连接至关重要。
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测试可穿戴产品的连接性是一种完全不同的挑战。对于所有世界领先的天线测试解决方案而言，关键要求在于短时市场需求、完美连接要求、靠近人体时功效减弱以及娇小型可穿戴设备的驱动问题。
MVG采用探针阵列技术打造出一系列适合可穿戴产品的测试系统，创新使用的近场球面几何形状可满足处于不同位置人体佩戴时所需的快速准确测试。
相关产品
StarWave
SG Evo
400 MHz - 50000 MHz
StarMIMO
400 MHz - 6000 MHz
SG 64
70 MHz - 18000 MHz
SG 24
400 MHz - 10000 MHz
StarLab
650 MHz - 18000 MHz
StarLab 50 GHz
650 MHz - 50000 MHz
MiniLAB | 6 GHz OTA
650 MHz - 6000 MHz
MVG WaveStudio
Antenna Measurement Services
SG 32
相关资源
移动设备设计中的天线测试有哪些阶段？
Advancements in Antenna Measurement Techniques With Application to Civilian & Military Wireless Communication Devices
Antenna Coupling Evaluation Based on Accurate Measured Source Models and Simulations
Planar Wide Mesh Scanning using Multi-Probe Systems
Accurate Antenna Characterisation at VHF/UHF Frequencies with Plane Wave Generator Systems
Revision Progress IEEE Std 1720 Recommended Practice for Near-Field Antenna Measurements
5G Antenna Test and Measurement Systems Overview
60 GHz Reference Chip Antenna for Gain Verification of Millimeter Wave Test Chambers
Experimental validation of Reference Chip Antennas for 5G Measurement Facilities at mm-Wave
OTA Testing of Antennas and Devices using Plane Wave Synthesizer
介绍StarWave - 首席技术官Per Iversen访谈
Relative Phase Reconstruction Based on Multiprobe Solutions and Post-Processing Techniques
Over the Air Testing of Active Antenna System Base Stations in Compact Antenna Test Range
Combining Measurements and Simulations for antenna coupling analysis
High Performance Dual Polarized Near-Field Probe at V-Band Provides Increased Performances for Millimeter Wave Spherical Near-Field Measurements
Measurement Uncertainties in Millimeter Wave “On-Chip” Antenna Measurements
Design of Dual Polarized Wide Band Plane Wave Generator for Direct Far Field Testing
Reduced Sampling in NF Antenna Measurement Using Numerical Defined Expansion Functions
Testing Antenna Chip-Sets under Thermal Conditions
